Bruker Introduces Inspire Nanoscale Chemical Mapping System
July 10 2014 - 7:00AM
Business Wire
System features new PeakForce IR SPM Mode for
Comprehensive Nanocharacterization
Bruker (NASDAQ: BRKR) today announced the release of
Inspire™, the first integrated scanning probe microscopy
(SPM) infrared system for 10-nanometer spatial resolution in
chemical and materials property mapping. The new and unique
Inspire system incorporates Bruker’s proprietary PeakForce
IR™ mode to enable nanoscale infrared reflection and absorption
mapping for a wide range of applications, including the
characterization of microphases and their interfaces in polymer
blends, plasmons in the two-dimensional electron gas of graphene,
and chemical heterogeneity in complex materials and thin films.
Bruker's new integrated scanning probe
microscopy (SPM) infrared system - Inspire (Photo: Business
Wire)
The Inspire system features sensitivity down to molecular
monolayers, even on samples not amenable to standard atomic force
microscopy techniques. Inspire utilizes fully integrated
infrared scattering, scanning near-field optical microscope (SNOM)
optics, point-and-click alignment, and the full suite of exclusive
PeakForce Tapping® technologies found on Bruker’s
performance-leading AFMs, from ScanAsyst® self-optimization to
quantitative PeakForce QNM® nanomechanics and PeakForce KPFM™ work
function measurements. The resulting Inspire solution now
provides instant access to the highest resolution chemical,
plasmonics, nanomechanical, and electrical characterization for new
scientific research and nano-analytical frontiers.
“The infrared scattering SNOM technique has great potential for
new scientific discoveries through highest resolution
spatio-spectral imaging,” explained Professor Markus B. Raschke,
Departments of Physics and Chemistry, and JILA, at the University
of Colorado, Boulder. “Its wide, productive application has been
held back by the lack of an integrated solution.”
“With Inspire, we now have provided this integrated
solution, which is a major milestone on our path to enable even
more widespread AFM adoption by providing new, nanoscale chemical
information to researchers,” added David V. Rossi, Executive Vice
President and General Manager of Bruker's AFM Business.
“Inspire builds upon our exclusive PeakForce Tapping
technology to provide a complete set of the highest resolution
nanochemical and nanomechanical property maps together with
topography in a single SPM measurement.”
About Inspire
Inspire is a scanning probe based nanoscale
characterization system that extends atomic force microscopy into
the chemical regime by providing infrared absorption and reflection
imaging down to a spatial resolution of 10 nanometers utilizing
scattering scanning near-field optical microscopy (SNOM).
Inspire includes all optics, detectors and configurable
sources, as well as all AFM hardware and software for atomic
resolution imaging in a compact and robust integrated package.
Inspire also comes with Bruker’s new PeakForce IR mode,
which builds on Bruker’s exclusive PeakForce Tapping direct force
control technology. PeakForce IR overcomes the limitations of
contact and of TappingMode™, and thus of traditional near-field
optical and photothermal approaches to nanoscale infrared imaging.
It also avoids sample damage from lateral forces, retaining highest
resolution on soft polymers, and enables high-resolution imaging of
polymer brushes and even powders. PeakForce IR includes ScanAsyst
self-optimization and PeakForce QNM for instantly correlated
nanomechanical data. The comprehensive set of optional modes
includes PeakForce TUNA™, which enables conductivity mapping on
samples not amenable to contact mode AFM, and PeakForce KPFM, which
employs FM detection for the highest spatial resolution work
function mapping while avoiding the mechanical cross-talk affecting
single-pass FM-KPFM.
About Bruker Corporation
Bruker Corporation is a leading provider of high-performance
scientific instruments and solutions for molecular, cellular and
materials research, as well as for industrial, diagnostics,
clinical research and applied analysis. For more information about
Bruker Corporation, please visit www.bruker.com.
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Media Contact:Bruker Nano Surfaces DivisionStephen
Hopkins, +1-520-741-1044 x1022Marketing
Communicationssteve.hopkins@bruker-nano.comorInvestor
Contact:Bruker CorporationJoshua Young, +1-978-663-3660
x1479Vice President, Investor RelationsJoshua.young@bruker.com
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