Nanometrics Delivers 100th Atlas III System for Advanced Process Control Metrology
August 01 2018 - 4:05PM
Nanometrics Incorporated (NASDAQ: NANO), a leading provider of
advanced process control solutions, announced that it has delivered
its 100th Atlas® III system for advanced process control
metrology. The Atlas III is deployed in advanced memory and
logic device manufacturers utilizing Nanometrics proprietary
analysis software including NanoDiffract® and SpectraProbe™. With
its proprietary combination of spectroscopic ellipsometry with full
Mueller Matrix capability and broadband reflectometer, the Atlas
III provides industry-leading performance and cost of ownership.
“We are excited to achieve this milestone with the Atlas III,
just two years after we started shipping systems,” stated Dr.
Pierre-Yves Lesaicherre, president and chief executive officer of
Nanometrics. “The rapid adoption and ramp of the Atlas III
reflects Nanometrics’ technology leadership as the pioneer of
optical critical dimension (OCD) metrology and the close
partnerships we have with our key customers. The Atlas III
provides our customers additional insight to control and debug
their most complex device manufacturing processes and is
instrumental to the ramp of leading-edge devices.”
“The Atlas III is the fastest-ramping product in Nanometrics’
history,” commented Sudhakar Raman, vice president and general
manager of the automated metrology systems business unit at
Nanometrics. “The Atlas III is the third generation in the
Atlas family, first introduced in 2004, and is our flagship
automated system supporting advanced OCD and thin films metrology
with our proprietary ellipsometry and reflectometry
technologies. The Atlas III delivers best-in-class precision
and repeatability at faster overall system throughput, supporting a
broad variety of process control applications. These systems
are qualified at the top five 3D-NAND manufacturers, two of the
largest DRAM manufacturers, and leading foundry customers for
sub-10nm devices.” When combined with NanoDiffract, the Atlas
III enables high-fidelity metrology on the most complex
three-dimensional structures. When utilizing SpectraProbe,
the Atlas III provides unique insight into on-device and in-die
control for advanced yield learning and process optimization.
About Nanometrics
Nanometrics is a leading provider of advanced, high-performance
process control metrology and inspection systems used primarily in
the fabrication of semiconductors and other solid-state devices,
including sensors, optoelectronic devices, high-brightness LEDs,
discretes and data storage components. Nanometrics' automated and
integrated metrology systems measure critical dimensions, device
structures, topography and various thin film properties, including
three-dimensional features and film thickness, as well as optical,
electrical and material properties. The company's process control
solutions are deployed throughout the fabrication process, from
front-end-of-line substrate manufacturing, to high-volume
production of semiconductors and other devices, to advanced
three-dimensional wafer-level packaging applications. Nanometrics'
systems enable advanced process control for device manufacturers,
providing improved device yield at reduced manufacturing cycle
time, supporting the accelerated product life cycles in the
semiconductor and other advanced device markets. The company
maintains its headquarters in Milpitas, California, with sales and
service offices worldwide. Nanometrics is traded on NASDAQ Global
Select Market under the symbol NANO. Nanometrics' website is
http://www.nanometrics.com.
Forward Looking StatementsCertain
statements in this press release are forward-looking statements
that involve a number of risks and uncertainties that could cause
actual results to differ materially from those described in this
release. Although Nanometrics believes that the expectations
reflected in the forward-looking statements are reasonable, actual
results could differ materially from these expectations due to a
variety of factors, including, but not limited to: Nanometrics’
inability to ship products as scheduled or achieve customer
acceptance of new products; shifts in the timing of customer orders
and product shipments; and general economic conditions. For
additional information and considerations regarding the risks faced
by Nanometrics that could cause actual results to differ
materially, see its annual report on Form 10-K for the year ended
December 31, 2016, as filed with the Securities and Exchange
Commission on March 3, 2017 including under the caption “Risk
Factors,” as well as other periodic reports filed with the SEC from
time to time. Nanometrics disclaims any obligation to update
information contained in any forward-looking statement, except as
required by law.
Investor Relations Contact:
Claire McAdams
Headgate Partners LLC
530.265.9899
claire@headgatepartners.com
Company Contact:
Kevin Heidrich
SVP Corporate Development
503.207.4611
kheidrich@nanometrics.com
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