Verigy Nanoelectronics Digital Solution Targets Failure Mechanisms at 65nm and Below for Yield Improvement
June 26 2007 - 11:01AM
Business Wire
Verigy (NASDAQ:VRGY), a premier semiconductor test company, today
introduced the V93000 Nanoelectronics Digital solution for
structural and functional test for wafer sort and final test of
advanced digital ICs at 65nm and beyond. By providing accurate
diagnostic and parametric data, the Nanoelectronics Digital
solution allows manufacturers to target new failure mechanisms that
reduce manufacturing yield at 65nm and smaller, a key challenge in
the migration to new smaller nodes. The solution delivers insights
that benefit new designs and does so efficiently, accelerating
time-to-market at the lowest cost-of-test (CoT). �The
nanoelectronics era challenges conventional wisdom about the role
of test in the manufacturing flow,� said Pascal Ronde, vice
president of sales, services and support, Verigy. �Automated test
equipment is relinquishing its role as simply a pass/fail tool, and
becoming a critical yield-enhancement tool for high volume
manufacturing. Our new solution will allow V93000 users to collect
accurate diagnostic and parametric data required for testing
nanoelectronics, and its multi-site efficiency will set a new
standard in productivity.� As they move to process nodes at 65nm
and smaller, manufacturers are facing test challenges caused by new
failure mechanisms, such as transition and bridging faults, design
process interaction and inter- and intra-die variations. The
challenge is made greater by growing scan vector volumes, plus more
use of on-chip compression and built-in self-test (BIST)
structures. Measurement accuracy also becomes more critical due to
the lower voltages and higher speeds typical with smaller
geometries, in addition to the integration of performance analog
and DC. With the challenging initial yields in nanoelectronics,
accurate measurements have taken on new importance for closing the
loop between test and design to enable rapid yield learning and
improvement. Verigy recognizes the imperative for a solution that
allows maximum insight while achieving the highest possible
manufacturing efficiency, including rapidly moving the data off the
tester for volume yield diagnostics. It allows manufacturers to
take advantage of the latest test methodologies, such as more
multi-site, reduced pin count access, and loop-back methodologies,
while reducing data collection to only the most relevant
information. Integrated Hardware for Optimal Throughput Verigy
incorporates the industry's highest functionality per square
centimeter onto single slot cards inserted into the V93000 test
head, for smaller tester footprint and lower cost. The V93000
Nanoelectronics Digital solution includes the following compact
test head-based configurations: Pin Scale 400 digital pin card,
scaling from DC IO to 533 Mbps; Integrated large fail-data capture
and ultra-fast data transfer; DC Scale DPS32 -- 32 channels per
card for testing multiple power; domains in multi-site, and fast
synchronous triggering for improved repeatability and highest
throughput; STIL link package; Integrated TIA per pin. More
information can be found at www.verigy.com/go/NanoDigital. Pricing
and Availability The Nanoelectronics Digital solution starts at USD
$499,000, and is available now. About the Verigy V93000 The Verigy
V93000 provides a scalable architecture for testing SoCs,
system-in-packages (SIPs) and high-speed memory devices. The
V93000, now with more than 1,500 systems installed worldwide, meets
the industry�s demanding performance and cost challenges, whether
for at-speed engineering characterization or high-volume
production. The test system provides massive multi-site
capabilities, with data rates up to 12.8 Gbps and supports a full
range of digital, mixed-signal and RF applications. It provides low
cost-of-test for wireless applications such as cellular, WLAN,
WiMax, and UWB. About Verigy Verigy designs, develops,
manufactures, sells and services advanced test systems and
solutions for the memory and system-on-chip segments of the
semiconductor industry. Verigy�s scalable platform systems are used
by leading semiconductor companies worldwide in design validation,
characterization, and high volume manufacturing test. Formerly part
of Agilent Technologies, the company began doing business as Verigy
on June 1, 2006, and completed its initial public offering on June
13, 2006. Information about Verigy can be found at www.verigy.com.
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