Verigy’s Yield Learning Solution Helps Semiconductor Manufacturers Accelerate Time-to-Market and Maximize Entitlement Yield
June 23 2009 - 4:05PM
Business Wire
Verigy (NASDAQ:VRGY), a premier semiconductor test company,
today introduced its Yield Learning Solution, a comprehensive
solution that integrates on-tester, real-time capture and
statistical analysis of electrical failures on complex
system-on-chip (SOC) die. The Yield Learning Solution will be
showcased at the SEMICON West trade show in Verigy�s Booth #921,
South Hall, July 14 to 16, 2009 at the Moscone Convention Center in
San Francisco.
The Verigy Yield Learning Solution offers a unique combination
of pre-analysis modules on the Verigy V93000 SOC test platform with
a design-centric analysis and visualization toolset. This makes it
possible for manufacturers to efficiently triage large quantities
of electrical failures into specific logical faults. By seamlessly
linking electrical test with physical layout data it allows fast
localization of the root cause physical defects. Verigy�s Yield
Learning Solution enables users to more efficiently identify both
visible and non-visible yield loss mechanisms, accelerating
time-to-production by more than four weeks and increasing
entitlement yield by up to six percent.
Diagnosing problems in nanometer level device design and
manufacture is becoming more challenging which makes closing the
loop between design, fab, and test essential. Verigy�s Yield
Learning Solution efficiently links test back into both design and
the fab, providing logic bitmaps for both stuck-at and difficult to
detect timing faults in scan chains and logic. The Yield Learning
Solution provides both the high accuracy required for the lab and
the high throughput needed for production � critical for both new
product introduction and ongoing manufacturing monitoring.
�Because of the tremendous investment in resources associated
with designing at 45nm and below, our customers need a solution
that enables them to collaborate with their foundry, whether
in-house or outsourced, to quickly diagnose their defects using
secure IP-protected information,� said Larry Dibattista, General
Manager, DfX Solutions, Verigy. �Verigy�s Yield Learning Solution
not only facilitates this efficient collaboration, but also
characterizes these design problems, providing semiconductor
manufacturers with a unique capability to respond to and correct
yield excursions in real-time which in turn accelerates
time-to-market.�
Best-in-Class
Integrated Solution
Verigy�s Yield Learning Solution consists of the V93000 scalable
architecture, Triage Fault Locator and YieldVision software
toolsets, the most advanced on-tester and software tools for
failure data capture and yield analysis. The unique, scalable
architecture of the V93000 allows for complete integration with the
Yield Learning Solution. Triage software�s proprietary algorithms
enables unprecedented data processing efficiency and the
YieldVision analysis and visualization tools dramatically reduce
the time required to diagnose problems by localizing the root cause
physical defect. The result is significantly faster time to problem
diagnosis and resolution.
About Verigy
Verigy�provides advanced semiconductor test systems and
solutions�used by leading companies worldwide in design validation,
characterization, and high-volume manufacturing test. Verigy
offers�scalable platforms�for a wide range of system-on-chip
(SoC)�test solutions,�and memory test solutions�for Flash,
DRAM�including high-speed memories,�as well as multi-chip packages
(MCP). Advanced analysis tools accelerate design debug and yield
ramp processes for Verigy�s customers. Additional information on
Verigy�s Yield Learning Solution can be found at
www.verigy.com/go/yield.
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