Touchdown Technologies, a Verigy Company, Introduces Single-Touchdown, Full-Wafer Probe Card for Advanced DRAM Testing
July 01 2010 - 4:05PM
Business Wire
Touchdown Technologies, a wholly owned subsidiary of leading
semiconductor test company Verigy (NASDAQ: VRGY), today introduced
its 1Td300 full-wafer probe card, the company’s first probe card
for single-touchdown, high-volume testing of advanced DRAM memory
devices. Touchdown Technologies will demonstrate the new product,
capable of highly parallel testing of 300 mm or 200 mm wafers, in
Verigy’s booth (#5847 in North Hall) at the SEMICON West trade
show, July 13-15 in San Francisco, Calif.
Capable of testing an entire 300 mm wafer with only 2 g of force
per probe – the lowest probe force in the industry and less than
half that of comparable products on today’s market – the 1Td300
probe card offers the dual advantages of reducing forces on the
wafer under test and the entire test cell as well as allowing
higher pin counts to extend semiconductor testing roadmaps.
According to the International Technology Roadmap for
Semiconductors (ITRS), parallelism will increase from 512 sites
tested in 2010 to 768 for commodity DRAM wafer testing in 2011.
This equates to a pin count of more than 50,000 for today’s DRAMs,
climbing toward 100,000 as die sizes continue to shrink.
“As pin counts escalate for advanced semiconductors such as DDR3
memories, reducing the cost of test requires ever-increasing levels
of parallelism,” said Patrick Flynn, president of Touchdown
Technologies – a Verigy Company. “With our new 1Td300 probe card,
we’ve developed a reliable, single-touchdown testing solution with
ultra-low force that achieves the required planarity and scrub
performance without risking damage to the devices under test.”
Touchdown Technologies’ new probe card utilizes proprietary,
full-wafer architecture and MEMS-based ACCU-TORQ™ torsion probes to
perform highly planar, single-touchdown testing.
This product launch follows last year’s introduction of
Touchdown Technologies’ first 1Td300 single-touchdown probe card
for NAND and NOR Flash memories.
About Touchdown Technologies –
a Verigy Company
Incorporated in 2004, Touchdown Technologies designs,
manufactures and supports advanced MEMS probe cards for testing
semiconductor wafers and dies. In 2009, Touchdown Technologies
became a wholly owned subsidiary of Verigy, a leading provider of
semiconductor test equipment. As a Verigy company, Touchdown
Technologies is dedicated to driving down the cost of test by
delivering innovative, scalable technologies for high-parallelism
probe cards. The company is uniquely positioned to address all
memory applications including DRAM, NAND, NOR and Serial Flash.
Additional information about Touchdown Technologies can be found at
www.tdtech.com.
About Verigy
Verigy provides advanced semiconductor test systems and
solutions used by leading companies worldwide in design validation,
characterization, and high-volume manufacturing test. Verigy offers
scalable platforms for a wide range of system-on-chip (SOC) test
solutions, and memory test solutions for Flash, DRAM including
high-speed memories, as well as multi-chip packages (MCP). Verigy
also provides advanced analysis tools that accelerate design debug
and yield ramp processes. Additional information about Verigy can
be found at www.verigy.com.
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