Verigy’s New HSM3G High-Speed Memory Test Solution Offers Low Cost of Test for DDR3, DDR4 and Beyond
July 08 2010 - 4:05PM
Business Wire
Further extending the testing capabilities of its V93000 HSM
platform for the DDR3 generation of mainstream memory ICs and
beyond, Verigy (NASDAQ:VRGY), has introduced its new HSM3G
high-speed memory test solution. The V93000 HSM3G’s unique
advantage is its future-ready upgradeability, enabling it to
deliver low cost of test for the next three generations of DDR
memories with data-transfer rates up to 6.8 Gbps for unprecedented
long-term test economics.
Verigy will demonstrate its new memory test card technology in
booth #5847 in North Hall at the SEMICON West trade show, July
13-15 in San Francisco, Calif.
“Memory manufacturers are seeking an economical ATE solution
that not only meets their productivity and functionality needs, but
also provides longer lifetime value and investment protection
beyond a single device generation,” said Hans-Juergen Wagner, vice
president of SOC test at Verigy. “Our scalable V93000 HSM test
platform achieves an unprecedented lifetime that delivers
outstanding return on investment over at least three device
generations, from DDR3 to DDR4 to future generations of mainstream
DRAM. These test economics are literally unmatched anywhere else in
the industry.”
The V93000 HSM3G is future-ready in terms of speed and
functionality, offering the most complete feature set available in
the high-speed memory test market. Its programmable, at-speed APG
per-pin with support for data bus inversion (DBI) and cyclic
redundancy check (CRC) data generation enables testing of advanced
DDR4 memory technology features, ensuring high test quality and
yield.
Due to its memory ATE per-pin throughput, the V93000 HSM3G
provides test-time savings of up to 20 percent. It delivers fully
parallel pattern execution, fully parallel DC tests and eye-width
measurements, which provides high multi-site efficiency.
The V93000 HSM3G achieves a native 2.9 Gbps data rate and true
256-site DDR3 parallel testing over the entire speed range without
any test-time overhead or compromises to accuracy, functionality,
test coverage and yield. Due to its native speed headroom, the
HSM3G addresses all mainstream DDR3 speed bins as well as high-end
gamer DDR3 and the first two DDR4 volume speed grades. The V93000
platform architecture assures upgradeability to even higher speed
devices in the future.
About Verigy
Verigy provides advanced semiconductor test systems and
solutions used by leading companies worldwide in design validation,
characterization, and high-volume manufacturing test. Verigy offers
scalable platforms for a wide range of system-on-chip (SOC) test
solutions, and memory test solutions for Flash, DRAM including
high-speed memories, as well as multi-chip packages (MCP). Verigy
also provides advanced analysis tools that accelerate design debug
and yield ramp processes. Additional information about Verigy can
be found at www.verigy.com.
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