High safety and reliability ratings of the GOWIN mid- and
low-density FPGAs prompt automotive OEMs to design them into
applications including video bridging, display driving and image
signal processing
LONDON and GUANGZHOU, China, April
30, 2024 /PRNewswire/ -- GOWIN Semiconductor Corporation,
the world's fastest-growing FPGA manufacturer, today announced that
its GOWIN EDA FPGA design environment has been certified compliant
with the ISO 26262 and IEC 61508 functional safety standards by the
TUV testing laboratory.
Certification of the FPGA design tool provides strong assurance
to automotive OEMs that module designs featuring a GOWIN Arora-V
(mid-density), Arora-II (low-/mid-density) or LittleBee
(low-density) FPGA can meet the requirements for system-level
functional safety specified in the ISO 26262 and IEC 61508
standards.
The award of functional safety certification is expected to
spark a new wave of interest in GOWIN's FPGAs, which are available
in versions qualified to AEC-Q100 Grade 2, with qualification to
AEC-Q100 Grade 1 pending. Existing quality and reliability
certificates applicable to the GOWIN product range include
IATF16949, ISO 9001, ISO 14001 and ISO/IEC 17025.
Thanks to a superior feature set – including a wider range of
high-speed video, display and graphics interfaces than other FPGAs
in the same segment of the market – and a strong reliability record
for devices fabricated on TSMC's 22nm LP process, GOWIN FPGAs are
already used in vehicles for applications such as:
- Video bridging and local display dimming in infotainment
systems
- Image signal processing of camera outputs in advanced driver
assistance systems (ADAS)
- USB audio interfacing
- Display monitoring and safety back-up in the instrument
cluster
GOWIN's CEO Jason Zhu said:
'GOWIN is attracting growing interest in the automotive industry
because of its innovations in FPGA design in the low- and
mid-density segments. Notably, we uniquely provide hardcore MIPI
interfaces in FPGAs alongside DDR3 memory and high-speed LVDS and
PCIe interfaces.
'With the award of functional safety certification for our
popular GOWIN EDA development environment, we are confident in our
ability to make further inroads into the automotive markets in
Europe, North America and Asia.'
The GOWIN EDA FPGA design environment includes an FPGA design
tool, IP cores and reference designs. The FPGA design tool supports
the SystemVerilog, Verilog and VHDL programming languages. There
are no licensing restrictions on the use of GOWIN EDA, and it can
be downloaded free from www.gowinsemi.com.
GOWIN's automotive-qualified FPGA product range and the GOWIN
EDA development environment can be viewed at its stand 3A.340 at
Embedded World (Nuremberg, Germany, 9-11 April
2024).
About GOWIN Semiconductor Corporation
Founded in 2014,
Gowin Semiconductor Corp., headquartered with major R&D in
China, has the vision to
accelerate customer innovation worldwide with our programmable
solutions. We focus on optimizing our products and removing
barriers for customers using programmable logic devices. Our
commitment to technology and quality enables customers to reduce
the total cost of ownership from using FPGAs on their production
boards. Our offerings include a broad portfolio of programmable
logic devices, design software, intellectual property (IP) cores,
reference designs, and development kits. We strive to serve
customers in the consumer, industrial, communication, medical, and
automotive markets worldwide.
For more information about GOWIN Semiconductor, please
visit: https://www.gowinsemi.com/en/
Copyright 2024 GOWIN Semiconductor Corp. GOWIN, LittleBee®,
GW1N/NR/NS/1NSR/1NZ®, Arora®, Arora V®, GW2A/AR®, GOWIN EDA and
other designated brands included herein are trademarks of GOWIN
Semiconductor Corp. in China and other countries. All other
trademarks are the property of their respective owners.
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