JEOL : New Schottky Field Emission Scanning Electron Microscope JSM-IT810 Released
July 29 2024 - 9:00PM
Business Wire
- Improved operational efficiency from instrument adjustment
to observation and analysis by using automation technology
-
JEOL Ltd. (TOKYO:6951)(President and CEO: Izumi Oi) announces
the release of the new Schottky Field Emission Scanning Electron
Microscope JSM-IT810 on July 28, 2024. Field Emission Scanning
Electron Microscopes (FESEM) are widely used in science and
technology fields such as research institutes, universities, and
industry. There is a growing demand for an instrument that can be
used easily, accurately, quickly, and efficiently from observation
to analysis. The JSM-IT810 adds the "Neo Action" automatic
observation and analysis function and automatic calibration
function to the JSM-IT800, which is equipped with the
next-generation electron optical control system “Neo Engine” and
the “SEM Center” for high operability such as Zeromag and EDS
integration, to not only improve efficiency and productivity but
also help solve labor shortages.
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Schottky Field Emission Scanning Electron
Microscope JSM-IT810 (Photo: Business Wire)
Main Features
1. Automatic Observation and Analysis Function “Neo Action” All
you need to do is select the SEM image acquisition conditions and
field of view, and the function automatically performs SEM
observation and EDS (energy dispersive X-ray spectroscopy)
analysis. This function contributes to improving the efficiency of
routine work including analysis work.
2. Automatic Calibration Function “SEM Automatic Adjustment
Package” This function enables automatic execution of the selected
items in alignment adjustment, magnification adjustment, and EDS
energy calibration.
3. “Live Function” This function is capable of Live 3D, Live
Analysis, and Live Map functions. 3D images can be constructed on
the spot while an SEM observation is being performed to obtain
unevenness and depth information. In addition, it helps always
display characteristic X-ray spectrum and elemental mapping.
4. EDS Integration Observation by an SEM and analysis by an EDS
are integrated. Analysis of point, area, and MAP can be performed
from the observation screen. Incorporation of the Windowless
EDS-Gather-X enables detection from Li and analysis at a high
sensitivity and high spatial resolution.
Annual Unit Sales Target
220 units/year
Related link
Product Information : Schottky Field Emission Scanning Electron
Microscope JSM-IT810
https://www.jeol.com/products/scientific/sem/JSM-IT810.php
JEOL Ltd. 3-1-2, Musashino, Akishima, Tokyo, 196-8558, Japan
Izumi Oi, President & CEO (Stock code: 6951, Tokyo Stock
Exchange Prime Market) www.jeol.com
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JEOL Ltd. Science and Measurement Instruments Sales Division
TEL: +81-3-6262-3567 https://www.jeol.com/contacts/products.php